Detail mata kuliah Karakterisasi Material + Lab, program studi S2 - Teknik Metalurgi dan Material

Detail SAP: Karakterisasi Material + Lab Tahun Ajaran 2013/2014 -02


Satuan Acara Pengajaran
Mata Kuliah ENMT800005 - Karakterisasi Material + Lab
Pengajar Nofrijon Bin Imam Sofyan Ph.D
Tujuan Perkuliahan Setelah mengambil mata kuliah ini diharapkan mahasiswa mampu memahami prinsip dasar karakterisasi bahan untuk tujuan mengetahui sifat mekanik maupun sifat mikro bahan menggunakan pengujian yang merusak (DT) maupun pengujian tidak merusak (NDT) dan penggunaan alat ini baik sendiri maupun bersamaan untuk kemudian mampu mengapilikasikannya untuk tujuan pemecahan masalah yang berhubungan dengan bahan

Minggu Ke 1
Materi Class introduction - About the class - Rules - Grading - Brainstorming
Media LCD Projector
Referensi 1. C.R. Brundle, C.A. Evans, Jr., S. Wilson, Encyclopedia of Materials Characterization, Butterworth-Heinemann, Boston, 1992. 2. B.D Cullity, Elements of X-ray Diffraction, Addison-Wesley Publishing Co. Inc., Massachusetts, 1978. 3. ASM Metals Handbook, Vol 09 - Metallography and Microstructures 4. ASM Metals Handbook, Vol 10 - Materials Characterization 5. S. Amelinckx, D. van Dyck, J. van Landuyt, and G. van Tendeloo: Electron Microscopy Principles and Fundamentals, VCH Verlagsgescllschaft mbH, Weinheim (1997) 6. F.A. Settle: Handbook of Instrumental Techniques for Analytical Chemistry, Prentice Hall PTR (1997)
Aktivitas Lecture Problem solving

 

Minggu Ke 2
Materi Basic in Materials Characterization: Crystal Structure - Crystal system - Plane and direction - Atomic position - Exercise
Media LCD Projector
Referensi B.D. Cullity: Elements of X-ray Diffraction, 2nd ed., Addison-Wesley Publishing Company Inc., Reading, Massachusetts, 1978 C. Hammond: The Basics of Crystallography and Diffraction, 3rd ed., Oxford University Press Inc., New York, 2009. R.J.D. Tilley: Crystals and Crystal Structures, John Wiley & Sons Ltd., Chichester, West Sussex, England, 2006 W.D. Callister, Jr.. Fundamentals of Materials Science and Engineering, John Wiley & Sons, Inc., New York, 2001
Aktivitas Lecture Exercise

 

Minggu Ke 3
Materi Basic in Materials Characterization: Crystal Symmetry - Bravais Lattice - Point Group - Space Group - Notation and Symbol - Exercise
Media LCD Projector
Referensi B.D. Cullity: Elements of X-ray Diffraction, 2nd ed., Addison-Wesley Publishing Company Inc., Reading, Massachusetts, 1978 C. Hammond: The Basics of Crystallography and Diffraction, 3rd ed., Oxford University Press Inc., New York, 2009. R.J.D. Tilley: Crystals and Crystal Structures, John Wiley & Sons Ltd., Chichester, West Sussex, England, 2006 W.D. Callister, Jr.. Fundamentals of Materials Science and Engineering, John Wiley & Sons, Inc., New York, 2001
Aktivitas Lecture Lab preparation

 

Minggu Ke 4
Materi Basic in Materials Characterization: Stereographic Projection - Construction - Wulff Net - Zone Equation - Exercise
Media LCD Projector
Referensi B.D. Cullity: Elements of X-ray Diffraction, 2nd ed., Addison-Wesley Publishing Company Inc., Reading, Massachusetts, 1978 C. Hammond: The Basics of Crystallography and Diffraction, 3rd ed., Oxford University Press Inc., New York, 2009. R.J.D. Tilley: Crystals and Crystal Structures, John Wiley & Sons Ltd., Chichester, West Sussex, England, 2006 W.D. Callister, Jr.. Fundamentals of Materials Science and Engineering, John Wiley & Sons, Inc., New York, 2001
Aktivitas Lecture Exercise

 

Minggu Ke 5
Materi Fundamental Concept in Materials Characterization - Fundamental of X-Ray Diffraction - Diffraction by a Crystal - Bragg's Law - Structural Factor - Exercise
Media LCD Projector
Referensi C. Hammond: The Basics of Crystallography and Diffraction, 3rd Ed., Oxford University Press, 2009. B. D. Cullity: Elements of X-ray Diffraction, Addison-Wesley Publishing Company, Inc., 1978. R.J. D. Tilley: Crystals and Crystal Structures, John Wiley & Sons Ltd., 2006
Aktivitas Lecture Exercise

 

Minggu Ke 6
Materi Lab-1 Preparation of Al - Zn systems: No Zn Al 1 85.0 15.0 2 77.7 22.3 3 55.0 45.0 4 20.0 80.0
Media Lab coat Safety Google Lab equipment
Referensi [1] Thaddesius B. Massalski (Ed), et al., Binary Alloy Phase Diagrams, 2nd Ed. Vol. 1 (1990) 239 ? 241. [2] S Müller, L-W Wang and Alex Zunger, Modelling Simul. Mater. Sci. Eng. 10 (2002) 131 ? 145. [3] B. D. Cullity, Elements of X-Ray Diffraction, 2nd Ed., Addison-Wesley Publishing Co., Inc., Massachusetts (1978) 120, 350 ? 368. [4] P. Villars and L. D. Carvert, Pearson?s Handbook of Crystallographic Data for Intermetalic Phase, Metals Park OH: ASM (1985). [5] Theo Hahn (Ed.), International Tables for Crystallography, Vol. A Space-Group Symetry, IUCr, Kluwer Academic Publisher, (1995).
Aktivitas Laboratorium activity: casting

 

Minggu Ke 7
Materi Lab-2 X-Ray Diffraction: As-cast As-quench Quench-anneal
Media Laboratory equipment XRD
Referensi [1] Thaddesius B. Massalski (Ed), et al., Binary Alloy Phase Diagrams, 2nd Ed. Vol. 1 (1990) 239 ? 241. [2] S Müller, L-W Wang and Alex Zunger, Modelling Simul. Mater. Sci. Eng. 10 (2002) 131 ? 145. [3] B. D. Cullity, Elements of X-Ray Diffraction, 2nd Ed., Addison-Wesley Publishing Co., Inc., Massachusetts (1978) 120, 350 ? 368. [4] P. Villars and L. D. Carvert, Pearson?s Handbook of Crystallographic Data for Intermetalic Phase, Metals Park OH: ASM (1985). [5] Theo Hahn (Ed.), International Tables for Crystallography, Vol. A Space-Group Symetry, IUCr, Kluwer Academic Publisher, (1995).
Aktivitas Specimen Diffractogram from Lab-1

 

Minggu Ke 8
Materi Midterm
Media
Referensi
Aktivitas

 

Minggu Ke 9
Materi Metallography Specimen preparation Sectioning Mounting Grinding Polishing Etching
Media LCD Projector
Referensi 1. Kay Geels: Metallographic and Materialographic Specimen Preparation, Light Microscopy, Image Analysis and Hardness Testing, ASTM International, (2007) 2. Günter Petzow: Metallographic etching: techniques for metallography, ceramography, plastography, ASM International, Materials Park, OH, (1999)
Aktivitas Lecture

 

Minggu Ke 10
Materi Lab-3 SEM/EDX
Media Lab equipment Prepared Specimen
Referensi 1. S. Amelinckx, et al.: Electron Microscopy, Principles and Fundamentals, VCH Verlagsgescllschaft mbH, Weinheim, 1997. 2. C Richard Brundle, Charles A. Evans, Jr., and Shaun Wihon: Encyclopedia of Materials Characterization, Butterworth-Heinemann, MA, 1992. 3. S. J. B. Reed: Electron Microprobe Analysis and scanning electron Microscopy in Geology, Cambridge University Press, Cambridge, 2005.
Aktivitas Microstructure and composition characterization

 

Minggu Ke 11
Materi Project Assignment: Microstructure and Lattice Parameters Change in Al - Zn Alloys
Media Computer/Laptop
Referensi [1] Thaddesius B. Massalski (Ed), et al., Binary Alloy Phase Diagrams, 2nd Ed. Vol. 1 (1990) 239 - 241. [2] S Müller, L-W Wang and Alex Zunger, Modelling Simul. Mater. Sci. Eng. 10 (2002) 131 - 145. [3] B. D. Cullity, Elements of X-Ray Diffraction, 2nd Ed., Addison-Wesley Publishing Co., Inc., Massachusetts (1978) 120, 350 ? 368. [4] P. Villars and L. D. Carvert, Pearson?s Handbook of Crystallographic Data for Intermetalic Phase, Metals Park OH: ASM (1985). [5] Theo Hahn (Ed.), International Tables for Crystallography, Vol. A Space-Group Symetry, IUCr, Kluwer Academic Publisher, (1995).
Aktivitas Journal Writing and Preparation